Effect of 980-nm diode laser–aided circumferential supracrestal fiberotomy on fluorosed root surfaces
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چکیده: (1927 مشاهده) |
Objective: To evaluate and compare the root surface morphological changes after 980-nm diode laser–aided circumferential supracrestal fiberotomy (CSF) on fluorosed and non-fluorosed teeth. Materials and Methods: The sample comprised 27 orthodontic patients (14 males and 13 females mean age = 17.3 years) with and without fluorosis, from whom 40 fluorosed and 40 non-fluorosed premolar teeth were extracted for orthodontic reasons. Conventional (control group) and laser-aided (experimental group) CSF was performed on fluorosed and non-fluorosed teeth indicated for orthodontic extraction, using a scalpel and a 980-nm diode laser at 2.5 W power, respectively. Subsequently, teeth were extracted, sectioned, and examined by scanning electron microscope to assess the ultrastructural changes. Results: There were differences in surface morphology among fluorosed and non-fluorosed roots in the control group. The root specimens of both fluorosed and non-fluorosed teeth irradiated by diode laser exhibited no evidence of smear layer, laser-induced pitting or cavitation, linear cuts/markings, carbonization of surface, and heat-induced surface cracking. However, a glazed or slightly melted appearance was observed in root specimens of fluorosed teeth after diode laser irradiation. Conclusions: These findings suggest that the diode laser–aided CSF procedure is free from thermal hazard on non-fluorosed root surfaces but may provoke some thermal changes on fluorosed root surfaces.
Source: The Angel Orthodontists Full Text |
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واژههای کلیدی: Circumferential supracrestal fiberotomy، Diode laser، Fluorosis، Orthodontic، Scanning electron microscopy |
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نوع مطالعه: پژوهشي |
موضوع مقاله:
ارتودنسی دریافت: 1392/7/1 | انتشار: 1390/10/25
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